Jupiter XR AFM
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Jupiter XR AFM
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Jupiter XR AFM

Jupiter XR AFM

Jupiter XR showing a 200 mm wafer being placed on the sample chuck

  • Higher resolution than any other large-sample AFM

  • Extended range 100 μm scanner is 5-20× faster than most other AFMs

  • From setup to results, every step is simpler and faster

  • Modular design adapts to your needs for maximum flexibility

Highest Performance

  • Higher resolution than any other large-sample AFM
  • Extended-range scanner is 5-20× faster than most AFMs and features large 100 μm X-Y & 12 μm Z range
  • Exclusive blueDrive™ Tapping Mode gives more reproducible results and simplifies operation

Simpler User Experience

  • Fully-motorized laser and detector setup eliminates manual adjustment of knobs
  • Fully-addressable, high-speed stage rapidly reaches any point on 200 mm samples
  • Sharp top-view optics help you easily locate your precise region of interest
  • Go from atoms to large 100-μm scans and use any imaging mode, all with the single XR scanner

Versatility for Diverse Research Needs

  • Support for a full range of imaging modes
  • Modular design makes it fast and simple to add accessories and future upgrades
  • Flexible software makes routine measurements easy while enabling advanced research

Support that goes above and beyond your expectations

  • Includes a standard one-year comprehensive warranty
  • No-charge technical support and basic applications support for life
  • Affordable support agreements that offer extended warranties and advanced training

Included Operating Modes

  • Contact mode
  • DART PFM
  • Dual AC
  • Dual AC Resonance Tracking (DART)
  • Electrostatic Force Microscopy (EFM)
  • Force curves
  • Force Mapping Mode (force volume)
  • Force modulation
  • Frequency modulation
  • Kelvin Probe Force Microscopy (KPFM)
  • Lateral Force Mode (LFM)
  • Loss tangent imaging
  • Magnetic Force Microscopy (MFM)
  • Nanolithography
  • Nanomanipulation
  • Phase imaging
  • Piezoresponse Force Microscopy (PFM)
  • Switching spectroscopy PFM
  • Tapping mode (AC mode)
  • Tapping mode with digital Q control
  • Vector PFM

Included because Jupiter XR comes with blueDrive

  • AM-FM Viscoelastic Mapping Mode
  • Contact Resonance Viscoelastic Mapping Mode

Optional Operating Modes

  • Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
  • Current mapping with Fast Force Mapping
  • Electrochemical Strain Microscopy (ESM)
  • Fast Force Mapping Mode
  • High voltage PFM
  • Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)

High Voltage nanoTDDB

Nanoscale Time Dependent Dielectric Breakdown experiements up to ±150 V.

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High Voltage Accessory

High voltage operation up to ±150 V.

Fast Force Mapping

Celgard 3D atomic force microscope image

Force curve-based nanomechanical mapping mode.

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AM-FM Viscoelastic Mapping Mode

Polymer blend sample composed of polyethylene (darkest), polypropylene (matrix) and polystyrene (brightest). The 3D overlay of elastic modulus on topography. Image size: 25 um. AM-FM Viscoelastic Mapping Mode on Jupiter XR Atomic Force Microscope (AFM)

Tapping mod-based nanomechanical mapping mode.

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Conductive AFM

Jupiter Conductive AFM ORCA AFM Image

 

Conductive AFM imaging with the new ORCA cantilever holder.

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Scanning Capacitance Microscopy (SCM)

Scanning Capacitance Microscopy (SCM) of SRAM (Static RAM) single wall carbon nanotube dC/dV amplitude and phase AFM imaging

 

Capacitance measurements down to 1 aF accompanied by high resolution imaging and fast scanning.

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Imaging in Liquid

Jupiter Liquid Imaging AFM Image DNA

Droplet imaging with the new liquid cantilever holder.

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CoolerHeater

Polystyrene – polypropylene thin film was cooled from room temperature down to 0 °C. The image on the left shows the sample at 28 °C where the polypropylene crystallites and polystyrene round inclusions are well defined. The image on the right shows the same sample at 0 °C, now with an ice aggregate on the polypropylene portion of the sample.

Sub-zero temperature control with the CoolerHeater accessory.

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Variable Magnetic Field Module

erasing bits of a hard drive disk afm images 5670 gauss

Variation of magnetic field: in-plane and out-of-plane of the sample.

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PolyHeater

Polystyrene – polypropylene thin film was heated from room temperature up to 126 °C and cooled back to initial temperature. The image on the left shows the sample at 58 °C where the polypropylene crystallites and polystyrene round inclusions are well defined. The image on the right shows the same sample at 126 °C, a temperature at which the polypropylene crystallites melted and only the polystyrene inclusions are visible.

Sample heating up to 300°C with the PolyHeater accessory.

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