XPS, Chemical Mapping
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XPS, Chemical Mapping
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XPS, Chemical Mapping

X-ray photoelectron spectroscopy (XPS) and Ultraviolet photoelectron Spectroscopy (UPS) is used to analyze the surface chemistry of a material. XPS spectra are obtained by illuminating the sample surface with monochromatic X-rays and eventually measuring the photo emitted electrons.

In 1905 Albert Einstein received the Nobel Prize in Physics for his quantum mechanical interpretation of the photoelectric effect. Based on the results of Heinrich Hertz and Max Planck about the nature of light being an electromagnetic wave and about the general existence of discrete energy portions, nowadays named “quantum”, this has been a big step for basic science. At this time nobody knew, that this will evolve into the most important method for non-destructive surface chemical analysis. To reach this understanding the development of energy dispersive electron analyzers had been necessary. Thus it took several decades until Kai Siegbahn developed and experimentally realized the first experiment of this kind in the late 1960s, again resulting in a Nobel Prize in Physics. By excitation of electrons from solid samples using characteristic X-rays and detecting the number of photoelectrons in dependence of their kinetic energies it became possible to use the element specific electron energies to derive the chemical
composition of sample surfaces without destroying them. He named the method Electron Spectroscopy for Chemical Analysis, or in short ESCA. The global success of X-ray Photoelectron Spectroscopy (XPS) is a result of the development of methods for reliable and precise quantification of ESCA data with an elemental detection limit of <1% in the uppermost surface layers. Elemental chemical mapping is possible by energy filtered imaging or mapping of the respective surface.

SPECS is the world's leading researcher, developer and supplier of surface analysis systems for research and production including XPS instruments. SPECS scientists and engineers are included in a global team of more than 150 employees who design, manufacture, sell and maintain instruments for surface science, materials science and nanotechnology. SPECS is a leader in state-of-the-art technology, advanced components, compact and tailored systems for surface analysis. The head office of SPECS Surface Nano Analysis GmbH is located in the heart of Berlin, Germany.

Near ambient pressure photoelectron spectroscopy of fruit and vegetables. 
In this note we present first NAP-XPS results from a fresh tomato and apple using the EnviroESCA. Portions of tomato and apple were introduced into the system and the pressure was stabilized at 10 mbar. Different regions on the surface were studied and the photoelectron spectra show significant chemical differences between these regions. This study demonstrates the unique NAP XPS capabilities of the EnviroESCA and extends the field of applications to (processed) food samples and other natural or biological samples that could not be studied by XPS up to now.

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Spin-resolved photoelectron spectroscopy
Spin-resolved photoelectron spectroscopy experiments were performed in an experimental station consisting of an analysis and apreparation chamber. The preparation chamber is used for substrate cleaning, as well as for the preparation and magnetization of ferromagnetic thin films.

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Monochromated XPS of Hydrogen-Terminated Silicon (111)
The high resolution capability of the PHOIBOS 150 MCD-9 analyzer and the FOCUS 500 monochromator was demonstrated by XPS measurements on H terminated Silicon (111).

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Monochromated XPS of Silicon (111)
The high resolution capability of the PHOIBOS 150 MCD-9 analyzer and the FOCUS 500 monochromator was demonstrated by XPS measurements on GaSe terminated Silicon (111).

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More XPS Application

Surface sensitive spectroscopic methods, like Auger Electron Spectroscopy (AES), Low Energy Ion Scattering Spectroscopy (LEISS) and especially X-ray or UV excited Photoelectron Spectroscopy (XPS and UPS) became powerful tools to characterize the surface chemical composition, the chemical state of the surface electrons and the electronic properties of materials surfaces.

Modern related methods can give insight into the surface chemical structure, (Scanning Auger Microscopy (SAM), XPS chemical mapping or X-ray Photoelectron Diffraction (XPD)), or in the complete electronic and magnetic structure (Angle Resolved or Spin Resolved Photoelectron Spectroscopy (ARPES or Spin-PES).

Since about 10 years it is also possible to perform some of these spectroscopic methods also under environmental or Near Ambient Pressure (NAP) conditions, rather than in Ultrahigh Vacuum (UHV) to allow for operando characterization of surface chemical reactions or the characterization of liquids or gases and their interfaces to solids.

FlexMod

FlexMod is a series of specialized building-block type modules, that can be combined with each other or existing systems can later on be extended. There are well defined modules for XPS (FlexPS), SPM (FlexPM), Preparation (FlexPrep) and sample introduction (FlexIntro). 

ProvenX

The product portfolio of SPECS is enlarged with the ProvenX (proven eXperience) System Series which represents the quintessence of our extensive knowledge in developing and manufacturing complete systems for surface analysis that fulfills the most demanding scientific requirements. The series contains dedicated systems for ARPES, µ-ARPES and Momentum Microscopy, XPS/UPS as well as NAP-XPS.

NAP-XPS

In (Near) Ambient Pressure (N)AP-XPS Systems samples can be characterized operando in pressures up to 100 mbar. Special differentially pumped analyzers, like the PHOIBOS 150 NAP are used. For excitation either a synchrotron beam line via the windowless beam entrance stage WBE 4 or a monochromated small spot X-ray source can be connected.

XPS-UPS Systems

XPS/UPS systems are a standard tool for the characterization of the chemical composition and the electronic structure of the surfaces of solids. Often a preparation chamber is integrated, so that samples inserted through the Load Lock chamber can be cleaned before analysis.

SEM/SAM - XPS Systems

This system is designed to perform XPS analysis  with an X-Ray source, in combination with Scanning Electron and Auger Microscopy with an electron source and a secondary electron detector as part of the analysis system. With this system 2 analysis methods are combined to give a complementary, better and deeper understanding regarding sample surface properties.

HAXPES Systems

Hard X-ray Photoelectron Spectroscopy (HAXPES) can be performed either at synchrotrons or with laboratory sources, like the µFOCUS 730 HE monochromator. The analyzers require higher voltages, making special power supplies and detectors necessary. Optimized geometries are needed for high count rates.

ARPES/Spin-PES Systems

Angle-Resolved and Spin-Resolved Photoelectron Spectroscopy is very sensitive regarding the demands for ultimate energy and angle resolution. Thus, in ARPES and Spin-PES special system requirements are necessary: optimized geometries, lowest magnetic fields, special manipulators for ultralow sample temperatures, special UV or laser sources

X-ray photoelectron spectroscopyXPSUltraviolet photoelectron spectroscopyUPSESCAXPS spectroscopysurface researchmedicinebiologychemistrygeologyearth sciencelife sciencesmaterials researchindustryElectronics & SemiconductorEnergyFossilsNuclear
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