Alpha300A – AFM Microscope
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Alpha300A – AFM Microscope
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Alpha300A – AFM Microscope

The Witec Alpha 300A - AFM microscope was developed and designed to allow combination with other image acquisition techniques such as confocal Raman imaging. All of these image acquisition techniques are integrated into a compact microscope system structure and maximize footprint. Users, through easy operations such as rotating the control axis, can adjust back and forth between different methods of use. Modules can be easily combined with the AFM such as luminescence, fluorescence, polarization analyzer, bright field, dark field, SNOM and Raman image acquisition units.

  • Research grade optical microscope with 6 x objective turret
  • Video system: color video camera
  • LED white-light source for Köhler illumination of tip and sample
  • Manual sample or motorized positioning in x- and y-direction
  • Various piezo-driven scan stages, fully capacitive feedback-controlled
  • Microscope base with active vibration isolation system

WITec alpha300 is an operational and modular product line

Allows you to easily upgrade and expand the system while achieving optimal costs.

This is a product line that combines almost all scanning probes and optical microscopes to serve and meet many other customer requirements.

Each WITec alpha300 product line is equipped with new functions in the form of additional integrated features or can be upgraded later.

Hardware and software are used on all features or at the same time to ensure the best possible compatibility and ease of use

 

  • Contact Mode
  • AC Mode (Intermittent Mode, Phase Imaging)
  • Digital Pulsed Force Mode (DPFM)
  • Lift Mode™
  • Magnetic Force Microscopy (MFM)
  • Electrostatic Force Microscopy (EFM)
  • Force Distance Curves
  • Lithography and Nanomanipulation
  • Lateral Force Microscopy (LFM)
  • Chemical Force Microscopy (CFM)
  • Kelvin Probe Microscopy
  • others on request

AFM Cantilever:

  • Inertial drive cantilever mechanics for AFM sensors
  • Commercially available AFM cantilever can be used

 

Sensors:

  • AFM sensors, Acoustic AC mode type, with reflex coating, pre-mounted on magnetic rings
  • AFM sensors, contact mode type, with reflex coating, pre-mounted on magnetic rings
  • Commercially available sensors can be used

 

Computer Interface:

Application Examples

alpha300A topography woodlouse

AFM topography image of a fully developed sternal deposit from a woodlouse (P. scaber).

alpha300A magnetic force mode hard drive

Magnetic Force Measurement of PC Hard Drive. The measurements were performed using AC mode technique with magnetic tips.

WITec AFM Bacteria

Digital Pulsed Force Mode image of fossilized bacteria. The image shows the different adhesion levels of the sample surface.
micro microscopeelectron micro microscopeatomic force micro microscopeAFM micro microscopeAFManalytical equipmentsurface analysismaterials analysislife sciencescience earthenvironmental sciencenanotechnologysemiconductor
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