Asylum Research Cypher Family of AFMs

Cypher L AFM

Cypher L AFM

  • Higher resolution imaging than other AFMs in its price range

  • Ergo software helps you get the information you need quickly and easily

  • Priced in reach of typical startup funds, research grants, and R&D budgets

  • Future-proof your research with a fully upgradeable AFM

  • Compact AFM fits in limited lab space

Cypher S AFM Microscope

Cypher S Atomic Force Microscope (AFM microscope)

The Asylum Research Cypher S is the base model of the Cypher AFM microscope family. The Cypher S was the first commercially available fast-scanning AFM, and the Cypher family AFMs remain the only full-featured fast-scanning AFMs that are compatible with a complete range of modes and accessories. Cypher AFMs have also earned a reputation for easily achieving higher resolution than other AFMs. The Cypher S is a great AFM for both materials science and life science research for ambient measurements in both air and liquids. The Cypher S is fully upgradable later for environmental control options or even video-rate scanning.

  • Routinely achieve higher resolution than other AFM microscopes

  • Fast scanning with results in seconds instead of minutes

  • Every step of operation is simpler for remarkable productivity

  • Small footprint in the lab, huge potential to grow in capability

  • Support that goes above and beyond your expectations

Cypher ES Environmental AFM

Cypher ES Environmental Atomic Force Microscope (AFM)

The Asylum Research Cypher ES builds on the exceptional performance of the Cypher S and adds full environmental control features. The same high resolution, speed and stability are maintained while easily operating in controlled gas or liquid environments, at temperatures from 0-250°C, and in some of the harshest chemical environments. The Cypher ES is the ultimate AFM for the most demanding experimental requirements.

  • Routinely achieve higher resolution than other AFMs

  • Fast scanning with results in seconds instead of minutes

  • Every step of operation is simpler for remarkable productivity

  • Small footprint in the lab, huge potential to grow in capability

  • Support that goes above and beyond your expectations

  • Enables gas and liquid perfusion through a sealed cell

  • Controls sample temperature over a wide 0–250°C range

  • Broadest compatibility with harsh chemicals

Cypher VRS1250 Video-Rate High Speed AFM

The Cypher VRS1250 is twice as fast as the first-generation Cypher VRS, scanning at up to 1250 lines/second. This enables either higher temporal resolution with frame rates up to 45 frames/second or increased spatial resolution by collecting more image pixels at lower frame rates. Combined with ultra-stable imaging, an easy-to-use fully sealed sample cell with perfusion capability, and a full range of modes and accessories, the Cypher VRS1250 is ready to help you achieve your most ambitious research goals.

  • Designed for both ultra-high speed and ultra-high resolution
  • Stable imaging allows dynamic events to be captured without drift or parameter adjustments

  • Ease of use features make setup and imaging simple

  • Includes all the added flexibility and capabilities of the Cypher ES research AFM

 

Cypher L AFM Microscope

See more with higher resolution imaging

  • Easily obtain molecular and atomic resolution on samples including 2D materials and polymers

  • Routinely see details unobtainable on most other AFMs in this price range

Get the information you need quickly and easily

  • Asylum’s new Ergo software platform is designed with a streamlined workflow for quick, simple setup and intuitive image acquisition

  • Exclusive AutoPilot™ algorithms automatically optimize scan parameters for high quality images

  • Easily analyze and export images for presentation and publication directly from Ergo

Expand your research while saving lab space and budget

  • Compact size fits easily in existing labs without special facility requirements

  • Priced within reach of typical lab startup funds, many research grants, and most industrial R&D budgets

Future-proof your research by investing in a fully upgradable AFM

  • Cypher L is fully upgradable, allowing you to add new capabilities as you need them

  • Can be upgraded to the more powerful Cypher SCypher ES, and Cypher VRS1250 models to enable advanced characterization modes, environmental control accessories, and even video-rate imaging speeds

Cypher S AFM, Cypher ES AFM

Routinely achieve higher resolution than other AFM microscopes

  • Unmatched mechanical stability—noise floor half  that of any other AFM

  • Exceptionally low drift—higher resolution and straight lattice lines

  • Low noise electronics—no artifacts from electronic noise sources

Fast scanning with results in seconds instead of minutes

  • Scans 10-100× faster than typical AFMs

  • Supports the fastest, smallest probes (3×9 µm spot size—optional)

  • Fast scanning that goes beyond topography—also nanomechanics, CAFM, PFM

Every step of operation is simpler for remarkable productivity

  • ModeMaster™ automatically configures software for selected mode

  • SpotOn™ makes the fully motorized laser and detector alignment one-click

  • GetReal™ automatically calibrates the cantilever spring constant and sensitivity

  • GetStarted™ automatically sets optimal parameters for tapping mode imaging

  • blueDrive™ makes tapping mode simpler, more stable, and more quantitative

Small footprint in the lab, huge potential to grow in capability

  • Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)

  • Unmatched range of nanoelectrical and electromechanical characterization modes

  • Upgradeable to the Cypher ES for environmental control accessories and to Cypher VRS for video-rate imaging

  • Many standard operating modes and even more optional modes

Support that goes above and beyond your expectations

  • Includes a standard one-year comprehensive warranty

  • No-charge technical support and basic applications support for life

  • Affordable support agreements that offer extended warranties and advanced training

  • Easy upgrade path to the Cypher ES or Cypher VRS

Cypher ES Polymer Edition AFM

Routinely achieve higher resolution than other AFMs

  • Unmatched mechanical stability—noise floor half  that of any other AFM
  • Exceptionally low drift—higher resolution and straight lattice lines
  • Low noise electronics—no artifacts from electronic noise sources

Fast scanning with results in seconds instead of minutes

  • Scans 10-100× faster than typical AFMs
  • Supports the fastest, smallest probes (3×9 µm spot size—optional)
  • Fast scanning that goes beyond topography—also nanomechanics, CAFM, PFM

Every step of operation is simpler for remarkable productivity

  • ModeMaster™ automatically configures software for selected mode
  • SpotOn™ makes the fully motorized laser and detector alignment one-click
  • GetReal™ automatically calibrates the cantilever spring constant and sensitivity
  • GetStarted™ automatically sets optimal parameters for tapping mode imaging
  • blueDrive™ makes tapping mode simpler, more stable, and more quantitative

Small footprint in the lab, huge potential to grow in capability

  • Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)
  • Unmatched range of nanoelectrical and electromechanical characterization modes
  • Upgradeable to the Cypher VRS for video-rate imaging
  • Many standard operating modes and even more optional modes

Support that goes above and beyond your expectations

  • Includes a standard one-year comprehensive warranty
  • No-charge technical support and basic applications support for life
  • Affordable support agreements that offer extended warranties and advanced training
  • Easy upgrade path to the Cypher VRS

Enables gas and liquid perfusion through a sealed cell

  • Fully sealed sample cells maintain a controlled environment and eliminate the risk of leaks
  • Compatible with fast scanning and all environmental control accessories

Includes sample temperature control from ambient to 250°C

  • Optional Heater-Cooler extends the sample temperature range to 0–120°C
  • Low-drift design lets you keep imaging while ramping the temperature
  • Quick and easy to setup and use, no external controllers, tubing, wires, etc.

Broadest compatibility with harsh chemicals

  • Sample cells are constructed so that only fused silica and the probe clip (PEEK or stainless steel) are in contact with liquid
  • Optional glovebox configuration allows use with oxygen or water sensitive materials

Cypher VRS1250 AFM

Designed for ultra-high speed and spatial resolution

  • Select the ideal balance between imaging speed and imaging resolution for your experiments

  • Cypher AFM’s easily and consistently achieve higher resolution than other AFM’s

  • The Cypher VRS1250 enables true video-rate imaging at rates up to 45 frames/second

Stable imaging keeps the “focus” on your sample

  • The Cypher’s advanced design balances thermal expansion to virtually eliminate thermal drift

  • blueDrive photothermal excitation technology keeps imaging stable over long durations

  • Fully sealed sample cell keep imaging stable such that even delicate biomolecules can be observed without damage

Ease of use features make it easier to get great results

  • The Cypher VRS1250 is designed with the same ease-of-use features as other Cypher AFM’s

  • Motorized laser and detector alignment and simple probe loading make setup fast and easy

  • A fully sealed sample cell eliminates worries over leakage

  • Software includes features to easily process and export video-rate AFM movies for presentations and publications.

All the flexibility and capabilities of Cypher AFM's

  • The Cypher VRS1250 supports all the functionality and associated benefits of the Cypher ES environmental AFM

  • Options include sample heating and cooling and a complete range of operating modes.

  • Cypher VRS 1250 is much more than just a video-rate AFM. The platform is the ideal AFM for interdisciplinary research groups and shared imaging facilities.

AM-FM Viscoelastic Mapping Mode

AM-FM Viscoelastic Modulus Mapping of a polystyrene (PS) / polycaprolactone (PCL) polymer thin film on mica. Image was taken using blueDrive photothermal excitation on a Cypher S AFM at 2Hz. Scan size 5 µm.

AM-FM mode on Cypher AFMs combines the features and benefits of standard tapping mode with nanomechanical property mapping. Standard tapping mode provides non-invasive, high-resolution topographical imaging, while the resonance of the second mode is analyzed to quantitatively estimate both the elastic and loss moduli of the material and the tip-sample dissipation.

  • Tapping mode technique that measures both storage modulus, E’, and loss modulus, E’’
  • Good for samples from 50 kPa to 300 GPa
  • Fast – same speed as regular tapping mode

Cypher Accessories: Control Temperature and Gas Environments

Heater Sample Stage (Cypher ES)

Polymer melted and then recrystallized using the heater stage on the Cypher ES AFM

  • The Cypher ES Heating Stage allows heating of samples in gas environments from ambient to 250°C in a sealed environment.
    • Heats from ambient to 250°C in a completely sealed environment
    • Low-drift design allows large temperature changes while maintaining the same imaging area
    • Temperature is controlled through software, manually or programmatically (e.g. ramp and soak cycles)
    • Passive heat transfer and insulation eliminate the need for heat exchange liquids and pumps
    • No external control boxes or other modules are required. No extra clutter or complexity

Gas Cell (Cypher ES)

Polymer blend imaged in the Cypher ES gas cell

The Cypher ES gas cell allows operation in an ambient air environment or can be completely sealed for imaging in a controlled gas environment. For instance, polymer samples can imaged under an inert argon atmosphere during high temperature heating to avoid oxidation. The gas cell is included with the Cypher ES but can also be purchased as a spare part.

  • The gas cell is completely sealed for imaging in a gas environment

Interferometric Displacement Sensor (IDS)

The Interferometric Displacement Sensor (IDS) option for Asylum Research Cypher AFMs enables more quantitative Piezoresponse Force Microscopy (PFM) by eliminating the dominant source of artifacts. The ability to measure the electromechanical response without the influence of electrostatic artifacts enables both the unambiguous measurement of polarization switching hysteresis loops in ferroelectrics and, for the first time, highly repeatable measurements of the effective electromechanical coupling coefficient (deff).

Key Cypher IDS benefits:

  • Interferometric detection avoids PFM artifacts due to electrostatic cantilever-sample interactions.

  • More accurate, highly repeatable measurements of the electromechanical coupling coefficient (deff).

  • Avoids switching spectroscopy artifacts that cause hysteresis loops in non-ferroelectric materials.

  • Deflection noise floor that is 2-3× lower than typical OBD performance (typically <100 fm/√Hz).

Scanning Capacitance Microscopy (SCM): Accessory for Cypher AFM

Scanning Capacitance Microscopy (SCM) of SRAM (Static RAM) by AFM imaging channelsScanning Capacitance Microscopy (SCM) of SRAM (Static RAM) high speed AFM imagingScanning Capacitance Microscopy (SCM) of SRAM (Static RAM) single wall carbon nanotube dC/dV amplitude and phase AFM imaging

Scanning Capacitance Microscopy (SCM) is a nanoelectrical imaging technique available on Cypher and Jupiter XR atomic force microscopes that uses a microwave radio frequency (RF) signal to map electric charge carrier locations, dopant levels, and dopant types (p-type vs. n-type) in semiconductors and other samples. The newly designed Asylum Research SCM accessory offers significantly higher performance and capability than any other currently available SCM module. Benefits include:

  • Measures not just differential capacitance (dC/dV), but also capacitance, which is linearly correlated with dopant concentrations, enabling simpler interpretation of SCM data

  • Over 20× faster scanning improves productivity (images in as little as 10 seconds!)

  • High sensitivity enables measurements on semiconductorsenergy storage devices and 2D materials

  • Higher resolution imaging reveals smaller structures

High-Voltage Piezoresponse Force Microscopy (PFM)

PFM image of PVDF polymer. The piezoelectric response of PVDF is widely exploited in tactile sensors. PFM lateral amplitude is shown on 3D topography, 2 ?m scan. Sample courtesy D. Guo, Institute of Acoustics, Chinese Academy of Science.

The HV-PFM option on Cypher AFMs enables high sensitivity, high bias, and crosstalk-free measurements on piezoelectrics, including ferroelectrics and multiferroics. The kit includes an integrated high voltage amplifier (±150 V), high voltage cantilever holder, high voltage sample mount, and conductive cantilevers.

  • Crosstalk-free measurements

  • High sensitivity and speed

  • Uses exclusive Dual AC Resonance Tracking (DART)

  • Enables tip biases up to ±150 V

Electrochemistry Cell

Electrochemistry Cell Option for Cypher ES

The  Electrochemistry Cell (EC Cell) enables characterization of electrochemical processes (EC-AFM). The EC Cell kit includes a liquid cup, probe holder, sample holder, and standard electrodes. Users may choose their own potentiostat. The EC Cell is glovebox compatible. Available on all Cypher AFMs except the Cypher S.

  • Fully sealed EC cell with uniquely designed probe holder and liquid cup for easy imaging in fluid

  • Compatible with most common solvents electrolytes and electrode materials

  • Simple to clean and assemble, even with gloves

  • Optional heating and cooling stages allow investigation of electrochemical thermodynamics

  • Glovebox option provides the ultimate environmental control with no performance compromises

sMIM image of a semiconductor device showing possible failure points

Scanning Microwave Impedance Microscopy (sMIM)

sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors, and insulators on Cypher AFMs.

  • Provides higher lateral resolution (10×)

  • Operates up to 80× faster and at lower power compared to competing technologies

Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)

NanoTDDB principle of operation diagram

NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision on Cypher AFMs. Constant or ramped biases up to ±150 V can be applied while monitoring current through a conductive AFM probe.

  • The spatial resolution of the AFM tip enables local measurements of dielectric breakdown (~20 nm) on much smaller length scales than possible with conventional probe stations
  • Precisely select measurement points from high-resolution images, or a grid of points can be mapped and analyzed

Scanning Tunneling Microscopy (STM)

STM image of HOPG, 5 nm scan.

STM can be useful for ultra-high resolution imaging of conductive samples. Just like AFM imaging, STM benefits from the exceptional stability and low drift of the Cypher systems.

  • Useful for ultra-high resolution imaging of conductive samples

Electrochemical Strain Microscopy (ESM)

Electrochemical Strain Microscopy diagram

ESM is a novel scanning probe microscopy technique available on Cypher AFMs that is capable of probing electrochemical reactivity and ionic flows in solids with unprecedented resolution.

  • Probes electrochemical processes in battery and fuel cell materials
  • Measures the direct coupling of ionic current to strain in nm-scale volumes with unprecedented resolution

    Cypher L AFM

    Included Core Operating Modes

    • Tapping mode (AC mode) with phase

    • Contact mode with lateral force mode (LFM)

    Optional Operating Modes

    • Conductive AFM (CAFM)

    • Tapping mode in liquid droplet

    • Kelvin probe force microscopy

    Cypher S AFM, Cypher ES AFM 

    Included Operating Modes

    • Contact mode

    • DART PFM

    • Dual AC

    • Dual AC Resonance Tracking (DART)

    • Electrostatic Force Microscopy (EFM)

    • Force curves

    • Force Mapping Mode (force volume)

    • Force modulation

    • Frequency modulation

    • Kelvin Probe Force Microscopy (KPFM)

    • Lateral Force Mode (LFM)

    • Loss tangent imaging

    • Magnetic Force Microscopy (MFM)

    • Nanolithography

    • Nanomanipulation

    • Phase imaging

    • Piezoresponse Force Microscopy (PFM)

    • Switching spectroscopy PFM

    • Tapping mode (AC mode)

    • Tapping mode with digital Q control

    • Vector PFM

    Optional Operating Modes

    • AM-FM Viscoelastic Mapping Mode

    • Contact Resonance Viscoelastic Mapping Mode

    • Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode

    • Current mapping with Fast Force Mapping

    • Electrochemical Strain Microscopy (ESM)

    • Fast Force Mapping Mode

    • High voltage PFM

    • Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)

    • Scanning Microwave Impedance Microscopy (sMIM)

    • Scanning Tunneling Microscopy (STM)

    Cypher ES Polymer Edition AFM

    Included Operating Modes

    • Contact mode

    • DART PFM

    • Dual AC

    • Dual AC Resonance Tracking (DART)

    • Electrostatic Force Microscopy (EFM)

    • Force curves

    • Force Mapping Mode (force volume)

    • Force modulation

    • Frequency modulation

    • Kelvin Probe Force Microscopy (KPFM)

    • Lateral Force Mode (LFM)

    • Loss tangent imaging

    • Magnetic Force Microscopy (MFM)

    • Nanolithography

    • Nanomanipulation

    • Phase imaging

    • Piezoresponse Force Microscopy (PFM)

    • Switching spectroscopy PFM

    • Tapping mode (AC mode)

    • Tapping mode with digital Q control

    • Vector PFM

    Optional Operating Modes

    • Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode

    • Current mapping with Fast Force Mapping

    • Electrochemical Strain Microscopy (ESM)

    • High voltage PFM

    • Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)

    • Scanning Microwave Impedance Microscopy (sMIM)

    • Scanning Tunneling Microscopy (STM)

    Included in the Polymer Edition Package

    • AM-FM Viscoelastic Mapping Mode

    • Contact Resonance Viscoelastic Mapping Mode

    • Fast Force Mapping Mode

    Cypher VRS1250 Video-Rate High Speed AFM

    Included Operating Modes

    • Contact mode
    • DART PFM
    • Dual AC
    • Dual AC Resonance Tracking (DART)
    • Electrostatic Force Microscopy (EFM)
    • Force curves
    • Force Mapping Mode (force volume)
    • Force modulation
    • Frequency modulation
    • Kelvin Probe Force Microscopy (KPFM)
    • Lateral Force Mode (LFM)
    • Loss tangent imaging
    • Magnetic Force Microscopy (MFM)
    • Nanolithography
    • Nanomanipulation
    • Phase imaging
    • Piezoresponse Force Microscopy (PFM)
    • Switching spectroscopy PFM
    • Tapping mode (AC mode)
    • Tapping mode with digital Q control
    • Vector PFM

    Optional Operating Modes

    • Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
    • Current mapping with Fast Force Mapping
    • Electrochemical Strain Microscopy (ESM)
    • Fast Force Mapping Mode
    • High voltage PFM
    • Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
    • Scanning Capacitance Microscopy (SCM)
    • Scanning Microwave Impedance Microscopy (sMIM)
    • Scanning Tunneling Microscopy (STM)

    Included because Cypher VRS comes with blueDrive

    • AM-FM Viscoelastic Mapping Mode
    • Contact Resonance Viscoelastic Mapping Mode

     

     

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