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Higher resolution imaging than other AFMs in its price range
Ergo software helps you get the information you need quickly and easily
Priced in reach of typical startup funds, research grants, and R&D budgets
Future-proof your research with a fully upgradeable AFM
Compact AFM fits in limited lab space
Cypher S AFM Microscope

The Asylum Research Cypher S is the base model of the Cypher AFM microscope family. The Cypher S was the first commercially available fast-scanning AFM, and the Cypher family AFMs remain the only full-featured fast-scanning AFMs that are compatible with a complete range of modes and accessories. Cypher AFMs have also earned a reputation for easily achieving higher resolution than other AFMs. The Cypher S is a great AFM for both materials science and life science research for ambient measurements in both air and liquids. The Cypher S is fully upgradable later for environmental control options or even video-rate scanning.
Routinely achieve higher resolution than other AFM microscopes
Fast scanning with results in seconds instead of minutes
Every step of operation is simpler for remarkable productivity
Small footprint in the lab, huge potential to grow in capability
Support that goes above and beyond your expectations
Cypher ES Environmental AFM

The Asylum Research Cypher ES builds on the exceptional performance of the Cypher S and adds full environmental control features. The same high resolution, speed and stability are maintained while easily operating in controlled gas or liquid environments, at temperatures from 0-250°C, and in some of the harshest chemical environments. The Cypher ES is the ultimate AFM for the most demanding experimental requirements.
Routinely achieve higher resolution than other AFMs
Fast scanning with results in seconds instead of minutes
Every step of operation is simpler for remarkable productivity
Small footprint in the lab, huge potential to grow in capability
Support that goes above and beyond your expectations
Enables gas and liquid perfusion through a sealed cell
Controls sample temperature over a wide 0–250°C range
Broadest compatibility with harsh chemicals
Cypher VRS1250 Video-Rate High Speed AFM

The Cypher VRS1250 is twice as fast as the first-generation Cypher VRS, scanning at up to 1250 lines/second. This enables either higher temporal resolution with frame rates up to 45 frames/second or increased spatial resolution by collecting more image pixels at lower frame rates. Combined with ultra-stable imaging, an easy-to-use fully sealed sample cell with perfusion capability, and a full range of modes and accessories, the Cypher VRS1250 is ready to help you achieve your most ambitious research goals.
Stable imaging allows dynamic events to be captured without drift or parameter adjustments
Ease of use features make setup and imaging simple
Includes all the added flexibility and capabilities of the Cypher ES research AFM
Cypher L AFM Microscope
See more with higher resolution imaging
Easily obtain molecular and atomic resolution on samples including 2D materials and polymers
Routinely see details unobtainable on most other AFMs in this price range
Get the information you need quickly and easily
Asylum’s new Ergo software platform is designed with a streamlined workflow for quick, simple setup and intuitive image acquisition
Exclusive AutoPilot™ algorithms automatically optimize scan parameters for high quality images
Easily analyze and export images for presentation and publication directly from Ergo
Expand your research while saving lab space and budget
Compact size fits easily in existing labs without special facility requirements
Priced within reach of typical lab startup funds, many research grants, and most industrial R&D budgets
Future-proof your research by investing in a fully upgradable AFM
Cypher L is fully upgradable, allowing you to add new capabilities as you need them
Can be upgraded to the more powerful Cypher S, Cypher ES, and Cypher VRS1250 models to enable advanced characterization modes, environmental control accessories, and even video-rate imaging speeds
Cypher S AFM, Cypher ES AFM
Routinely achieve higher resolution than other AFM microscopes
Unmatched mechanical stability—noise floor half that of any other AFM
Exceptionally low drift—higher resolution and straight lattice lines
Low noise electronics—no artifacts from electronic noise sources
Fast scanning with results in seconds instead of minutes
Scans 10-100× faster than typical AFMs
Supports the fastest, smallest probes (3×9 µm spot size—optional)
Fast scanning that goes beyond topography—also nanomechanics, CAFM, PFM
Every step of operation is simpler for remarkable productivity
ModeMaster™ automatically configures software for selected mode
SpotOn™ makes the fully motorized laser and detector alignment one-click
GetReal™ automatically calibrates the cantilever spring constant and sensitivity
GetStarted™ automatically sets optimal parameters for tapping mode imaging
blueDrive™ makes tapping mode simpler, more stable, and more quantitative
Small footprint in the lab, huge potential to grow in capability
Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)
Unmatched range of nanoelectrical and electromechanical characterization modes
Upgradeable to the Cypher ES for environmental control accessories and to Cypher VRS for video-rate imaging
Many standard operating modes and even more optional modes
Support that goes above and beyond your expectations
Includes a standard one-year comprehensive warranty
No-charge technical support and basic applications support for life
Affordable support agreements that offer extended warranties and advanced training
Easy upgrade path to the Cypher ES or Cypher VRS
Cypher ES Polymer Edition AFM
Designed for ultra-high speed and spatial resolution
Select the ideal balance between imaging speed and imaging resolution for your experiments
Cypher AFM’s easily and consistently achieve higher resolution than other AFM’s
The Cypher VRS1250 enables true video-rate imaging at rates up to 45 frames/second
Stable imaging keeps the “focus” on your sample
The Cypher’s advanced design balances thermal expansion to virtually eliminate thermal drift
blueDrive photothermal excitation technology keeps imaging stable over long durations
Fully sealed sample cell keep imaging stable such that even delicate biomolecules can be observed without damage
Ease of use features make it easier to get great results
The Cypher VRS1250 is designed with the same ease-of-use features as other Cypher AFM’s
Motorized laser and detector alignment and simple probe loading make setup fast and easy
A fully sealed sample cell eliminates worries over leakage
Software includes features to easily process and export video-rate AFM movies for presentations and publications.
All the flexibility and capabilities of Cypher AFM's
The Cypher VRS1250 supports all the functionality and associated benefits of the Cypher ES environmental AFM
Options include sample heating and cooling and a complete range of operating modes.
Cypher VRS 1250 is much more than just a video-rate AFM. The platform is the ideal AFM for interdisciplinary research groups and shared imaging facilities.
AM-FM Viscoelastic Mapping Mode

AM-FM mode on Cypher AFMs combines the features and benefits of standard tapping mode with nanomechanical property mapping. Standard tapping mode provides non-invasive, high-resolution topographical imaging, while the resonance of the second mode is analyzed to quantitatively estimate both the elastic and loss moduli of the material and the tip-sample dissipation.
Cypher Accessories: Control Temperature and Gas Environments
Heater Sample Stage (Cypher ES)

Gas Cell (Cypher ES)

The Cypher ES gas cell allows operation in an ambient air environment or can be completely sealed for imaging in a controlled gas environment. For instance, polymer samples can imaged under an inert argon atmosphere during high temperature heating to avoid oxidation. The gas cell is included with the Cypher ES but can also be purchased as a spare part.
Interferometric Displacement Sensor (IDS)
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The Interferometric Displacement Sensor (IDS) option for Asylum Research Cypher AFMs enables more quantitative Piezoresponse Force Microscopy (PFM) by eliminating the dominant source of artifacts. The ability to measure the electromechanical response without the influence of electrostatic artifacts enables both the unambiguous measurement of polarization switching hysteresis loops in ferroelectrics and, for the first time, highly repeatable measurements of the effective electromechanical coupling coefficient (deff).
Key Cypher IDS benefits:
Interferometric detection avoids PFM artifacts due to electrostatic cantilever-sample interactions.
More accurate, highly repeatable measurements of the electromechanical coupling coefficient (deff).
Avoids switching spectroscopy artifacts that cause hysteresis loops in non-ferroelectric materials.
Deflection noise floor that is 2-3× lower than typical OBD performance (typically <100 fm/√Hz).
Scanning Capacitance Microscopy (SCM): Accessory for Cypher AFM



Scanning Capacitance Microscopy (SCM) is a nanoelectrical imaging technique available on Cypher and Jupiter XR atomic force microscopes that uses a microwave radio frequency (RF) signal to map electric charge carrier locations, dopant levels, and dopant types (p-type vs. n-type) in semiconductors and other samples. The newly designed Asylum Research SCM accessory offers significantly higher performance and capability than any other currently available SCM module. Benefits include:
Measures not just differential capacitance (dC/dV), but also capacitance, which is linearly correlated with dopant concentrations, enabling simpler interpretation of SCM data
Over 20× faster scanning improves productivity (images in as little as 10 seconds!)
High sensitivity enables measurements on semiconductors, energy storage devices and 2D materials
Higher resolution imaging reveals smaller structures
High-Voltage Piezoresponse Force Microscopy (PFM)

The HV-PFM option on Cypher AFMs enables high sensitivity, high bias, and crosstalk-free measurements on piezoelectrics, including ferroelectrics and multiferroics. The kit includes an integrated high voltage amplifier (±150 V), high voltage cantilever holder, high voltage sample mount, and conductive cantilevers.
Crosstalk-free measurements
High sensitivity and speed
Uses exclusive Dual AC Resonance Tracking (DART)
Enables tip biases up to ±150 V
Electrochemistry Cell

The Electrochemistry Cell (EC Cell) enables characterization of electrochemical processes (EC-AFM). The EC Cell kit includes a liquid cup, probe holder, sample holder, and standard electrodes. Users may choose their own potentiostat. The EC Cell is glovebox compatible. Available on all Cypher AFMs except the Cypher S.
Fully sealed EC cell with uniquely designed probe holder and liquid cup for easy imaging in fluid
Compatible with most common solvents electrolytes and electrode materials
Simple to clean and assemble, even with gloves
Optional heating and cooling stages allow investigation of electrochemical thermodynamics
Glovebox option provides the ultimate environmental control with no performance compromises

Scanning Microwave Impedance Microscopy (sMIM)
sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors, and insulators on Cypher AFMs.
Provides higher lateral resolution (10×)
Operates up to 80× faster and at lower power compared to competing technologies
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)

NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision on Cypher AFMs. Constant or ramped biases up to ±150 V can be applied while monitoring current through a conductive AFM probe.
Scanning Tunneling Microscopy (STM)

STM can be useful for ultra-high resolution imaging of conductive samples. Just like AFM imaging, STM benefits from the exceptional stability and low drift of the Cypher systems.
Useful for ultra-high resolution imaging of conductive samples
Electrochemical Strain Microscopy (ESM)

ESM is a novel scanning probe microscopy technique available on Cypher AFMs that is capable of probing electrochemical reactivity and ionic flows in solids with unprecedented resolution.
Cypher L AFM
Included Core Operating Modes
Tapping mode (AC mode) with phase
Contact mode with lateral force mode (LFM)
Optional Operating Modes
Conductive AFM (CAFM)
Tapping mode in liquid droplet
Kelvin probe force microscopy
Cypher S AFM, Cypher ES AFM
Included Operating Modes
Contact mode
DART PFM
Dual AC
Dual AC Resonance Tracking (DART)
Electrostatic Force Microscopy (EFM)
Force curves
Force Mapping Mode (force volume)
Force modulation
Frequency modulation
Kelvin Probe Force Microscopy (KPFM)
Lateral Force Mode (LFM)
Loss tangent imaging
Magnetic Force Microscopy (MFM)
Nanolithography
Nanomanipulation
Phase imaging
Piezoresponse Force Microscopy (PFM)
Switching spectroscopy PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
Vector PFM
Optional Operating Modes
AM-FM Viscoelastic Mapping Mode
Contact Resonance Viscoelastic Mapping Mode
Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
Current mapping with Fast Force Mapping
Electrochemical Strain Microscopy (ESM)
Fast Force Mapping Mode
High voltage PFM
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Scanning Microwave Impedance Microscopy (sMIM)
Scanning Tunneling Microscopy (STM)
Cypher ES Polymer Edition AFM
Included Operating Modes
Contact mode
DART PFM
Dual AC
Dual AC Resonance Tracking (DART)
Electrostatic Force Microscopy (EFM)
Force curves
Force Mapping Mode (force volume)
Force modulation
Frequency modulation
Kelvin Probe Force Microscopy (KPFM)
Lateral Force Mode (LFM)
Loss tangent imaging
Magnetic Force Microscopy (MFM)
Nanolithography
Nanomanipulation
Phase imaging
Piezoresponse Force Microscopy (PFM)
Switching spectroscopy PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
Vector PFM
Optional Operating Modes
Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
Current mapping with Fast Force Mapping
Electrochemical Strain Microscopy (ESM)
High voltage PFM
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Scanning Microwave Impedance Microscopy (sMIM)
Scanning Tunneling Microscopy (STM)
Included in the Polymer Edition Package
AM-FM Viscoelastic Mapping Mode
Contact Resonance Viscoelastic Mapping Mode
Fast Force Mapping Mode
Cypher VRS1250 Video-Rate High Speed AFM
Included Operating Modes