Asylum Research MFP-3D Family of AFMs
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Asylum Research MFP-3D Family of AFMs
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Asylum Research MFP-3D Family of AFMs

MFP-3D Origin AFM

MFP-3D Origin

The MFP-3D Origin™ features Asylum Research performance and quality at a price competitive with most low-cost AFMs. Origin marks the intersection of performance and affordability and offers high-resolution imaging, supports large samples, most imaging modes, and many accessories. It's simply the best place to start with AFM!

  • Easily the best research-grade AFM at this low price point

  • High performance—a single scanner scales from atomic resolution to huge 120 µm scans

  • Ease of use and a rugged, reliable design make it great for busy labs

  • Modes and accessories that take you beyond topography

  • Easily upgradable for additional functionality

  • Unmatched customer support worldwide

MFP-3D Origin+ AFM

MFP-3D Origin+ AFM

The MFP-3D Origin+ features high performance and extensive capabilities at a price competitive with most low-cost AFMs. The MFP-3D Origin+ is an extremely versatile and high performance research AFM ready for almost any field of research. It features the same core performance as the MFP-3D Origin but includes support for the complete range of innovative MFP-3D accessories. This makes it a tremendous value at a low price point where other AFMs often lag with lackluster performance and highly limited feature sets.

  • The highest performance and most capable AFM at this low price point

  • Full range of imaging modes and accessories

  • Rugged, reliable design makes it great for busy labs

  • Simple to use without sacrificing experimental flexibility

  • Customer support that is unmatched in the industry

MFP-3D-BIO AFM

MFP-3D BIO AFM

The Asylum Research MFP-3D-BIO sets the standard for integrating AFM and optical microscopy for bioscience research. It is the only bio-AFM that makes no compromises to AFM imaging resolution, force measurement performance, or application versatility while seamlessly integrating with a full range of optical techniques. This, along with unmatched support from Asylum experts, make it the best, most productive AFM to advance your research.

  • Uncompromised AFM performance integrated with optical microscopy

  • Simple, high-resolution imaging in liquid on soft biological samples

  • Performance leadership in force spectroscopy and force mechanics

  • Unmatched versatility to satisfy the diverse needs of multiple users

  • Unrivaled support from bio-AFM experts to get the results you need

MFP-3D Origin AFM

Easily the best research-grade AFM at this low price point

  • High-resolution imaging in both air and fluid — 120 µm XY range and 15 µm Z (40 µm optional)
  • Accurate, lowest-noise force measurements
  • Modern flexured and sensored scanner design makes the AFM easier to use and improves measurement accuracy
  • Engage and scan—quickly, easily and reliably

Ease of use and a rugged design make it great for busy labs

  • SmartStart™ automatically detects and configures system components to get results quickly
  • ModeMaster™ automatically configures software for selected mode
  • GetReal™ automatically calibrates the cantilever spring constant and sensitivity
  • GetStarted™ automatically sets optimal parameters for tapping mode imaging

Modes and accessories that take you beyond topography

  • Nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)
  • Large range of nanoelectrical and electromechanical characterization modes
  • Temperature control for heating samples to 275°C
  • Controlled gas or liquid environment options that are simple, safe and effective

Support that goes above and beyond your expectations

  • Includes a standard one-year comprehensive warranty
  • No-charge technical support and basic applications support for life
  • Affordable support agreements that offer extended warranties and advanced training
  • Easy upgrade path to the MFP-3D Origin+ or MFP-3D Infinity

MFP-3D Origin+ AFM

The highest performance and most capable AFM at this low price point

  • High-resolution imaging in both air and fluid — 120 µm XY range and 15 µm Z (40 µm optional)
  • Accurate, lowest-noise force measurements
  • Modern flexured and sensored scanner design makes the AFM easier to use and improves measurement accuracy
  • Engage and scan—quickly, easily, and reliably
  • Rugged, reliable design makes it great for busy labs

Full range of imaging modes and accessories

  • Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)
  • Unmatched range of nanoelectrical and electromechanical characterization modes
  • Numerous environmental accessories for temperature control
  • Controlled gas or liquid environment options that are simple, safe, and effective
  • Unique accessories for applying external forces to a wide range of samples

Simple to use without sacrificing experimental flexibility

  • SmartStart™ automatically detects and configures system components to get results quickly
  • ModeMaster™ automatically configures software for selected mode
  • GetReal™ automatically calibrates the cantilever spring constant and sensitivity
  • GetStarted™ automatically sets optimal parameters for tapping mode imaging

Support that goes above and beyond your expectations

  • Includes a standard one-year comprehensive warranty
  • No-charge technical support and basic applications support for life
  • Affordable support agreements that offer extended warranties and advanced training
  • Easy upgrade path to the MFP-3D Infinity

MFP-3D-BIO AFM

Uncompromised AFM performance integrated with optical microscopy

  • Illuminate or view with built-in top-down optics
  • Real-time optical navigation
  • High-quality objective allows easy viewing of opaque samples, laser alignment, and can be used as a condenser for brightfield or phase contrast illumination on transparent samples
  • Powerful real-time and offline rendering options including optical and AFM image overlays
  • Supports numerous optical techniques such as Brightfield, Phase Contrast, Epifluorescence, Confocal Microscopy, TIRF, FRET, FCS, FRAP, Ion Indicators (e.g. Ca2+ response)

Simple, high-resolution imaging in liquid on soft biological samples

  • Numerous environmental accessories for temperature control and simplifying imaging in liquid
  • Controlled gas or liquid environment options that are simple, safe and effective
  • SmartStart™ automatically detects and configures system components to get results quickly
  • ModeMaster™ automatically configures software for selected mode
  • GetReal™ automatically calibrates the cantilever spring constant and sensitivity
  • GetStarted™ automatically sets optimal parameters for tapping mode imaging

Performance leadership in force spectroscopy and force mechanics

  • Thermally-limited force resolution (<8 pm deflection noise tyical, <20 pm guaranteed)
  • Large Z range (15 µm standard, 40 µm extended Z option) accommodates demanding applications such as cell-cell and cell-substrate adhesion measurements
  • Choose between open-loop force curves with sensored Z for the ultimate in low noise performance or closed-loop Z for the most accurate velocity control
  • Force Mapping measures force-distance curves at a grid of points with automated fitting of indentation models for estimation of elastic modulus and automated adhesion/rupture force analysis

Unmatched versatility to satisfy the diverse needs of multiple users

  • Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)
  • Unmatched range of nanoelectrical and electromechanical characterization modes
  • Unique accessories for applying external forces to a wide range of samples

Unrivaled support from bio-AFM experts to get the results you need

  • Includes a standard one-year comprehensive warranty
  • No-charge technical support and expert applications support for life
  • Extended warranty and repair costs are the lowest in the industry

MFP-3D Origin AFM

 

Included Operating Modes

Contact mode
DART PFM
Dual AC™
Dual AC Resonance Tracking (DART)
Electrostatic Force Microscopy (EFM)
Force curves
Force Mapping Mode (force volume)
Force modulation
Frequency modulation
Kelvin Probe Force Microscopy (KPFM)
Lateral Force Mode (LFM)
Loss tangent imaging
Magnetic Force Microscopy (MFM)
Nanolithography
Nanomanipulation
Phase imaging
Piezoresponse Force Microscopy (PFM)
Switching spectroscopy PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
Vector PFM

Optional Operating Modes

AM-FM Viscoelastic Mapping Mode
Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
Scanning Thermal Microscopy (SThM)
Scanning Tunneling Microscopy (STM)

MFP-3D Origin+ AFM

Included Operating Modes

Contact mode
DART PFM
Dual AC™
Dual AC Resonance Tracking (DART)
Electrostatic Force Microscopy (EFM)
Force curves
Force Mapping Mode (force volume)
Force modulation
Frequency modulation
Kelvin Probe Force Microscopy (KPFM)
Lateral Force Mode (LFM)
Loss tangent imaging
Magnetic Force Microscopy (MFM)
Nanolithography
Nanomanipulation
Phase imaging
Piezoresponse Force Microscopy (PFM)
Switching spectroscopy PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
Vector PFM

Optional Operating Modes

AM-FM Viscoelastic Mapping Mode
Contact Resonance Viscoelastic Mapping Mode
Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
High voltage PFM
Scanning Microwave Impedance Microscopy (sMIM)
Scanning Thermal Microscopy (SThM)
Scanning Tunneling Microscopy (STM)

MFP-3D-BIO AFM

Included Operating Modes

Contact mode
DART PFM
Dual AC™
Dual AC Resonance Tracking (DART)
Electrostatic Force Microscopy (EFM)
Force curves
Force Mapping Mode (force volume)
Force modulation
Frequency modulation
Kelvin Probe Force Microscopy (KPFM)
Lateral Force Mode (LFM)
Loss tangent imaging
Magnetic Force Microscopy (MFM)
Nanolithography
Nanomanipulation
Phase imaging
Piezoresponse Force Microscopy (PFM)
Switching spectroscopy PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
Vector PFM

Optional Operating Modes

AM-FM Viscoelastic Mapping Mode
Contact Resonance Viscoelastic Mapping Mode
Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
High voltage PFM
Scanning Microwave Impedance Microscopy (sMIM)
Scanning Thermal Microscopy (SThM)
Scanning Tunneling Microscopy (STM)

 

Nanomechanical and Thermal Properties

AM-FM image of a multi-layered film from coffee bean packaging

AM-FM Viscoelastic Mapping Mode

Fast Force Mapping modulus image of a PS-PCL polymer blend

Fast Force Mapping Mode (FFM)

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Contact Resonance Viscoelastic Mapping Mode

Contact Resonance Viscoelastic Mapping Mode

Find out more

Scanning Thermal Microscopy (SThM) image of the R/W head from a commercial hard drive. SThM data is overlaid as color on the rendered surface topography, with darker regions exhibiting higher thermal conductivity. The difference in temperature between the yellow and orange regions is ~0.02°C. Polishing lines are clearly resolved in the topography. Imaged with the MFP-3D, 8.5µm scan.

Scanning Thermal Microscopy (SThM)

The ORCA™ Conductive AFM probe holder provides conductive AFM imaging and I-V measurement capabilities for all MFP-3D AFMs. The standard module is capable of measuring currents from…

Conductive AFM (ORCA)

CAFM image of Europium-doped ZnO sample, 2 µm scan. Sample courtesy of the Krishnan Lab, Univ. of Washington.

Find out more

Image shows vertical PFM amplitude overlaid on AFM topography for a lead titanate film, 5µm scan. Imaged with the MFP-3D AFM. Images courtesy of A. Gruverman and D. Wu, UNL. Sample courtesy H. Funakubo.

Piezoresponse Force Microscopy (PFM)

Find out more

Bismuth crystal growth on Boron Doped Diamond Electrode, 1.5µm scan. Image courtesy of R. Compton, Oxford University.

Electrochemistry Cell for MFP‑3D AFMs

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sMIM images of an SRAM sample (20 µm scan size, ~400 nm tall features). These images demonstrate the variety of data types that sMIM can measure.

Scanning Microwave Impedance Microscopy (sMIM)

Find out more

NanoTDDB was used to measure the breakdown voltage at each point on a 3 ?m pitch 6x6 grid on a SiO2 film.

 

Nanoscale Time Dependent Dielectric Breakdown (NanoTDDB)

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HOPG imaged on the MFP-3D using scanning tunneling microscopy (STM), 5 nm scan.

Scanning Tunneling Microscopy (STM)

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ESM of Silver Particles

Electrochemical Strain Microscopy (ESM)

Learn more >

Applying Other Driving Forces

 

 

MFP-3D High Voltage Kit

 

 

High Voltage Options and Kits

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NanoRack Sample Stretching Stage

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Electrical Probe Station

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Variable Magnetic Field Module

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Photovoltaic Illumination Option

 

Accessories for subjecting your sample to other driving forces like magnetic fields, mechanical strain, high voltage fields, and more.

Learn more >

Nanoelectrical and Electrochemical Properties

Tools for measuring electrical properties, including current, resistivity and permittivity, and more. Also includes PFM, STM, and EC-AFM techniques

Learn more >

Adapting to Your Experimental Needs

Additional options to make the MFP-3D work for you

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Temperature and Other Environmental Control

Accessories for controlling temperature, the gas environments (gas/vapor composition or humidity), and operating under ultra-low oxygen and/or water levels in a glovebox.

Learn more >

Operating in Liquid Environments

Accessories for operation in controlled liquid environments, with or without perfusion and for heating while operating in liquids.

Learn more >

 

OxfordMicroscopyatomic force microscopysurface researchmedicinebiologychemistrygeologyearth scienceslife sciencesmaterials researchindustryelectronics & semiconductorsenergyfossilsnuclear
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