Jacomex G[SAFE] - High Security Glove Box for Hazardous Materials
Specialized glove box for handling toxic substances, hazardous powders, or pathogens. Operates under negative pressure with dual HEPA filtration for total safety.
Xem thêmDB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM)
Model: DB550
Manufacturer: CIQTEK
Origin: China
Ion Source:
Type: Liquid Metal Ion Source (Ga⁺)
Resolution: 3 nm @ 30 kV
Beam current range: 1 pA ~ 65 nA
Acceleration voltage range: 500 V ~ 30 kV
Electron Gun:
Type: Schottky Field Emission Gun (FEG)
Resolution: 0.9 nm @ 15 kV, 1.6 nm @ 1.0 kV
Acceleration voltage range: 20 V ~ 30 kV
Beam current range: 1 pA ~ 20 nA
Magnification range: 1x ~ 2,500,000x (1–16x optical magnification)
Electron Optics:
Water-cooled constant power objective lens for enhanced imaging stability
“Super-Tunnel” high-voltage technology maintains resolution at low voltages
Aperture system: 6-position electrostatic switchable apertures, no manual adjustments
Non-crossover optical path to reduce system aberrations and enhance resolution
One-click switching between high-resolution imaging and high-beam-current modes
Vacuum System:
Pumps: 1 turbo molecular pump, 1 mechanical pump, 4 ion pumps
Control: Fully automated vacuum control with interlocking safety features
Vacuum levels:
Electron gun: ≤ 9×10⁻⁸ Pa
Chamber: ≤ 5×10⁻⁴ Pa
Sample Chamber & Stage:
Expansion interfaces: 24 ports for accessory integration
Stage type: 5-axis mechanical central stage
Travel ranges:
X = 110 mm, Y = 110 mm, Z = 65 mm
Tilt (T): –10° to +70°
Rotation (R): 360°, continuously adjustable
Sample chamber volume: W = 380 mm, H = 290 mm, D = 330 mm
Max sample size: Ø 300 mm, height = 70 mm
Hardware anti-collision module: Integrated stage current detection for collision prevention