Jacomex G[SAFE] - High Security Glove Box for Hazardous Materials
Specialized glove box for handling toxic substances, hazardous powders, or pathogens. Operates under negative pressure with dual HEPA filtration for total safety.
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ProvenX Systems: Quintessence of our extensive experience
The product portfolio of SPECS is enlarged with the ProvenX (proven eXperience) System Series which represents the quintessence of our extensive knowledge in developing and manufacturing complete systems for surface analysis that fulfills the most demanding scientific requirements. The series contains dedicated systems for ARPES, µ-ARPES and Momentum Microscopy, XPS/UPS as well as NAP-XPS.
The basic concept lying underneath is having a fixed, compact system layout and a large flexibility in choosing the analytical components like hemispherical electron energy analyzer, X-ray source, UV source, ion source, flood gun, etc. All possible components and system configurations have been already proven and found working. Since the ProvenX system series is a summing-up of all systems that we built up to now, the performance is confirmed and therefore, the system specifications, system drawings, factory and site acceptance tests as well as installation requirements are already available. The ProvenX systems are ready-to-order and come with a short delivery time from date of order.
ProvenX Series
ProvenX PS for state-of-the-art XPS and UPS analysis
ProvenX NAP system for state-of-the-art XPS and UPS analysis under near ambient pressure (NAP) conditions
Proven Analysis System for State-of-the-Art ARPES
Proven Analysis System for State-of-the-Art Momentum Microscopy
ProvenX DeviSim NAP system for state-of-the-art XPS and UPS analysis under near ambient pressure (NAP) conditions
Key Features
The ProvenX-PS system is a dedicated XPS/UPS system, equipped with PHOIBOS 150 electron analyzer with ultra-fast 128 channel delay-line detector with snapshot capability, FOCUS 500 dual anode monochromated X-ray source and optional UVS 10 high-flux UV source. The system comes with a clean UHV sample storage facility and a multi sample fast entry loadlock and can be additionally equipped with a dedicated preparation chamber as well as HPC 20 high pressure cell.
System control is done by the SpecsLab Prodigy software suite with integrated remote control packages, automated sample handling and a computer based vacuum control system.
The system can be equipped with an optional small spot x-ray source for material characterization, ion sources as well as electron and charge neutralization sources. Additional software and preparation tools are available.
ProvenX NAP system for state-of-the-art XPS and UPS analysis under near ambient pressure (NAP) conditions
KEY FEATURES
The ProvenX system series is the quintessence of our long experience in building high performance analysis systems for surface analysis. This system concept combines the most required analysis techniques with the latest and proven technology for ultimate performance.
The SPECS ProvenX NAP with backfilling configuration is a performance optimized system for state of the art NAP-XPS as well as NAP-UPS measurements from UHV up to 30 mbar pressure range. It contains a PHOIBOS 150 NAP analyzer with unsurpassed transmission and angular acceptance, a high performance small spot monochromatic X-ray source µ-FOCUS 600 NAP, a 4-axes manipulator with NAP different heating capabilities as well as an optional non-monochromatic UV source UVS 300 NAP.
The system comes with UHV sample storage facility and a multi sample fast entry loadlock. System control is performed by the SpecsLab Prodigy software suite with integrated remote control packages and a computer based vacuum control system.
The system can be equipped with additional sources for material characterization as well as a high pressure celll HPC 20 for sample preparation. Additional system extensions like continuous flow EC-cell or a preparation module can be added to the system.
KEY FEATURES
High Resolution Electron Momentum Mapping AnalyzerThe ProvenX-ARPES system is a dedicated small spot ARPES analysis tool, supporting the new ASTRAIOS 190 electron analyzer with single spot shifting lens, parallel single event detectors and optional 3D spin detection, as well as the UVS µFOCAL small spot UV source with optional monochromator. The sample handling is done by the SPECS Ganymed low temperature manipulator series. The system comes with a dedicated preparation chamber, a clean UHV sample storage facility and a multi sample fast entry loadlock.
System control is done by the SpecsLab Prodigy software suite with integrated remote control packages, automated sample handling and a computer based vacuum control system.
The system can be equipped with an optional small spot x-ray source for material characterization, electron sources and charge neutralization sources. Additional software and preparation tools are available
KEY FEATURES
High Resolution Momentum MicroscopeThe ProvenX-MM system is a specialized systembase for momentum microscopy solutions, supporting the KREIOS 150 Series, parallel single event detectors and optional spin detection, as well as the UVS µFOCAL small spot UV source with optional monochromator. The sample handling is done by the SPECS HESTIA low temperature microscopy stage. The system comes with a dedicated preparation chamber, a clean UHV sample storage facility and a multi sample fast entry loadlock.
System control is done by the SpecsLab Prodigy software suite with integrated remote control packages, automated sample handling and a computer based vacuum control system.
The system can be equipped with an optiopnal small spot x-ray source for material characterization. Additional software and preparation tools are available.
KEY FEATURES
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PHOIBOS 150 NAP energy analyzer with up to +/-22° acceptance angleThe SPECS ProvenX DeviSim NAP is a performance optimized system for state of the art measurements from UHV up to more than 30 mbar pressure range for laboratory use. It contains a PHOIBOS 150 NAP analyzer with unsurpassed transmission and angular acceptance, the cutting edge DeviSim NAP in-situ cell as small reactor inserted in the analysis chamber, a high performance small spot monochromatic X-ray source µ-FOCUS 600, a 4-axes manipulator for UHV measurements as well as an optional non-monochromatic UV source UVS 300.
The system comes with a dedicated preparation chamber, an UHV sample storage facility and a multi sample fast entry loadlock. System control is performed by the SpecsLab Prodigy software suite with integrated remote control packages and a computer based vacuum control system.
The system can be equipped with additional sources for material characterization as well as charge neutralization sources. Additonal software and preparation tools are available.