XPS EnviroESCA

It is Environmental, because it has a controllable atmosphere from sample loading to analysis, it contains an adaptable process gas dosing systemsm it allows for the use of several specialized SampleEnvironments and it is compatible with all kinds of samples and sizes up to Ø 120 mm and 40 mm in height.

It is versatile, because it uses a revolutionary analyzer technology and a μ-focus X-ray source. Thus is is a high resolution XPS system for any type of sample due to the environmental charge compensation by the gas phase. If needed it also includes sputter depth profiling using either monoatomic Ar-ions or Ar clusters.

It is completely integrated. This means, that it is anergonomic all-in-one design enabling quick installation and setup. The downtime is minimized due to its reliability and maintenance-friendly structure with easy consumables replacement. All-in-all this makes EnviroESCA a cost and time efficient servicing tool for every day use in laboratories and aside a production line.

EnviroESCA is a reliable tool because of complete documentation of all parameters, including the system status, the possibility to define and store reproducible analysis recipes and templates, and an Uptime focussed user support.
Finally the system is optimized by the application oriented software package Keystone, a automated vacuum system with remote operation ability, simple sample loading and a clear optical 3D sample navigation procedure avoiding.

KEY FEATURES

  • Fast Quality Control 
  • High Throughput Analysis
  • Controllable Atmosphere
  • Revolutionary Technology
  • Ergonomic all-in-one Design
  • Fully Software Controlled

EnviroESCA enables analyses at pressures far above UHV. It is designed for high-throughput analysis and opens up new applications in the fields of medical technology, biotechnology and the life sciences. It offers the shortest loading-to-measurement time on samples of all types including liquids, tissue, plastics and foils, powders, soil, zeolites, rocks, minerals and ceramics.

It is Environmental, because it has a controllable atmosphere from sample loading to analysis, it contains an adaptable process gas dosing systemsm it allows for the use of several specialized SampleEnvironments and it is compatible with all kinds of samples and sizes up to Ø 120 mm and 40 mm in height.

It is versatile, because it uses a revolutionary analyzer technology and a μ-focus X-ray source. Thus is is a high resolution XPS system for any type of sample due to the environmental charge compensation by the gas phase. If needed it also includes sputter depth profiling using either monoatomic Ar-ions or Ar clusters.

It is completely integrated. This means, that it is anergonomic all-in-one design enabling quick installation and setup. The downtime is minimized due to its reliability and maintenance-friendly structure with easy consumables replacement. All-in-all this makes EnviroESCA a cost and time efficient servicing tool for every day use in laboratories and aside a production line.

EnviroESCA is a reliable tool because of complete documentation of all parameters, including the system status, the possibility to define and store reproducible analysis recipes and templates, and an Uptime focussed user support.
Finally the system is optimized by the application oriented software package Keystone, a automated vacuum system with remote operation ability, simple sample loading and a clear optical 3D sample navigation procedure avoiding.

Give up the limitations of ultrahigh vacuum in XPS and explore new applications every day. Further information and system specifications can be found on the EnviroESCA product page.

EnviroESCA is integrated with two main components that determine the product's features as follows:

PHOIBOS 150 NAP 1D-DLD:State of the art hemispherical energy analyzer with 1D-DLD detector for photoelectron spectroscopy measurements (XPS and UPS) in the pressure regime from UHV to near ambient pressure (NAP)

The PHOIBOS 150 NAP Analyzer is a true 180° hemispherical energy analyzer with 150 mm mean radius. It consists of a differentially pumped electrostatic pre-lens, with a three-stage differentially pumped PHOIBOS 150 analyzer. Thus, the design concept provides four separate pressure stages separated by apertures. The first pumping stage (pre-lens) is separated from the analytic chamber by a nozzle with a customizable opening at the tip with diameters between 0.3 mm and 1 mm. By using a turbopump on the pre-lens stage, a pressure difference of four orders of magnitude (compared to the analysis chamber) can be achieved.The first and second stages are separated by an aperture. An in-lens gate valve allows a high-vacuum seal between of the PHOIBOS 150 Analyzer and NAP pre-lens and enables venting of the analysis chamber and pre-lens without venting the energy analyzer.

For Imaging NAP-XPS the pre-lens can be equipped with the SPECS NAP-XPS Imaging Lens Module that supports two different operation modes, one optimized for lateral resolution and one for transmission. In the lateral resolving mode the acceptance angle can be freely adjusted between +/- 3° to +/- 8° giving an ultimate lateral resolution of better than 10 µm with an acceptance area of 0.6 mm in diameter.

KEY FEATURES

  • Wide Angle Pre-Lens with 44 ° Acceptance Angle
  • Near Ambient Working Pressures up to 100 mbar (depending on configuration)
  • Large pass energy range
  • Working range up to 3.5 keV (upgradable to 7 keV with corresponding power supply and detector)
  • High energy and angular resolution
  • High spatial resolution with imaging lens module
  • Ultimate flexibility by switching between high transmission and high lateral resolution mode
  • Fast detectors with high dynamic range for fast real time data acquisition in snapshot mode
  • Pneumatic in-lens gate valve
  • 4 differential pumping stages
  • Full detector flexibility (MCD, 1D-DLD, 2D-DLD, 2D-CCD/-CMOS)

IQE 12/38: The ion source IQE 12/38 is an extractor type, differentially pumped ion source producing a focused, scannable ion beam of high current density.

The IQE 12/38 operates with a filament and ionizes the gas by electron bombardment. Its long-lifetime special Yttrium oxide coated Iridium filament makes the source suitable for reactive and inert gases. In sensitive environments, differential pumping ensures low pressure during operations of the source.
The two-lens system of the source allows easy changing of the spot size, which is continuously variable from 160 µm to 1000 µm. The PU-IQE12/38 power supply can be remotely controlled and provides key stone correction of the scan area to generate flat crater bottoms on tilted samples.

KEY FEATURES

  • Scannable with large scan area
  • Special filament for long lifetime and operation with reactive gases
  • Differential pumping for low pressure applications
  • Power supply with integrated scan and deflection unit
  • Keystone correction for depth profiling at tilted angles

Sputter Depth Profiling of Iodine in Organic Thin Films
This application note presents how the optional GCIB source of the EnviroESCA can be used for sputter depth profiling of iodine-containing (bio)organic thin film samples using Argon cluster Arn+ (n= 500-5000).
more detail

Photoelectron attenuation correction for quantitative NAP XPS
In this note we present quantitative NAP XPS results from a polytetrafluoroethylene (PTFE) sample using the EnviroESCA. A PTFE sample was analyzed in oxygen and water vapor atmospheres at pressures ranging from 1 mbar to 15 mbar. This study demonstrates the ability of NAP XPS to deliver reliable quantification results after correcting the photoelectron attenuation in the ambient gas atmosphere. more detail

Operando NAP-XPS study of plasma-enhanced surface reactions
Operando NAP-XPS study of plasma-enhanced surface reactions
First results of an operando NAP-XPS experiment on a silver surface during an air plasma cleaning process are presented. The observed chemical changes are plasma-induced and monitored under working conditions.more detail

 

Near ambient pressure photoelectron spectroscopy of fruit and vegetables
In this note we present first NAP-XPS results from a fresh tomato and apple using the EnviroESCA. Portions of tomato and apple were introduced into the system and the pressure was stabilized at 10 mbar. Different regions on the surface were studied and the photoelectron spectra show significant chemical differences between these regions. This study demonstrates the unique NAP XPS capabilities of the EnviroESCA and extends the field of applications to (processed) food samples and other natural or biological samples that could not be studied by XPS up to now.more detail

  • Chia sẻ qua viber bài: XPS EnviroESCA
  • Chia sẻ qua reddit bài:XPS EnviroESCA

PRODUCTS

Loading...

RELATED PRODUCTS

IQM Resonance – Quantum Cloud Platform

IQM Resonance – Quantum Cloud Platform Supplier: IQM – Finland IQM Resonance is a fully managed cloud-based quantum computing platform that provides instant access to advanced Quantum Processing Units (QPUs), ideal for enterprises, research institutes, and academic environments.
Xem thêm

IQM Radiance 20, 54 and 150 Qubits quantum computer

IQM Radiance 20, 54 and 150 Qubits quantum computer Model: IQM Radiance Manufacturer: IQM Quantum Computers - Finland Origin: Finland IQM Radiance is an advanced superconducting quantum computing platform designed for high-performance computing (HPC) centers, data centers, government agencies, and enterprises seeking to harness quantum advantage. With high-quality qubits and hybrid integration, Radiance is an ideal solution for practical applications in machine learning, cybersecurity, energy optimization, and chemical research.
Xem thêm