Atom Probe Tomography EIKOS

The Atom Probe that enables routine, high performance 3D nano-analysis for both research and industry. Building on 30 years of success in Atom Probe Tomography (APT) instrumentation and application, CAMECA announces EIKOS-UV™, the Atom Probe Microscope that brings APT to the next  generation of material scientists, metallurgists, physicists, geologists and engineers.

EIKOS-UVTM: Accessible APT
The new EIKOS-UV™ provides excellent analytical performance from a platform optimized for both efficiency and simplicity of operation. EIKOS-UV™ delivers all of the benefits of APT - nanoscale characterization of materials with the best combination of high spatial resolution and detection sensitivity - in an easy to use, affordable package.

 

The EIKOS Atom Probe offers:

  • Three-dimensional tomography with nanoscale characterization of microstructures
  • High spatial resolution single atom detection with high efficiency
  • Equal sensitivity to all elements and their isotopes
  • Quantitative composition measurement (sub-nm to near micron scale)
  • Available in voltage or voltage & laser configurations
  • Standard specimen preparation methods


EIKOS is available in 2 configurations:

EIKOS
The base EIKOS system incorporates a reflectron design to provide excellent mass resolving power and signal to noise. A pre-aligned integrated counter electrode ensures ease of use and high reliability. The voltage pulsing system provides very high data quality on a wide variety of metallurgical applications.

EIKOS-UV
The fully configured EIKOS-UV system combines all the outstanding features of the base EIKOS (voltage pulsed, reflectron based functionality, prealigned counter electrode) and adds a fully integrated 355 nm laser pulsing module with computer controlled focused spot design to provide access to a larger application range.

The base EIKOS system is field upgradable to the EIKOS-UV.

Characterizing grain boundaries with LEAP Atom Probe

Grain boundary analysis in metals (APT)

The LEAP 5000 and EIKOS Atom Probes offer unique capabilities for nanoscale chemical analysis and 3D imaging of grain boundaries in metals and alloys. 

Keep Reading

 

Nanoscale characterization of phase change materials with Atom Probe Tomography

Investigation of phase change separation processes (APT)

Thanks to unique spatial resolution capabilities, CAMECA Atom Probes can investigate phase separation processes in energy storage materials. Keep Reading


An Introduction to Atom Probe TomographyAPT Intro

Looking for a brief overview of the technique? Perfect for sharing with researchers just starting in APT.

 

Grain boundary analysis in NdFeB with Atom Probe Tomography and t-EBSD

Grain boundaries in NdFeB alloy - 3D Atom Probe data combined with t-EBSD

The grain boundaries visible in the tEBSD data show copper segregation (orange dots) and a NdO precipitate (gray dots). Combining crystallographic data with 3D APT data provides for a more complete picture of the material.

 

Introduction to applications & technology of EIKOS-UV

Optimized or efficiency and simplicity, EIKOS-UV™ delivers all the benefits of Atom Probe Tomography and addresses a wide range of applications: metals, coatings, thin films, ceramics, minerals, functional materials in both academic and commercial environments. Register here to view at any time. Click here to view

An Introduction to IVAS LT

If you have atom probe data, and are looking for an efficient and free method to conduct analyses, check out IVAS LT. This free version of IVAS software allows you to conduct a number of different tests on your data. Learn more by watching this free, short webinar, and then download your copy of IVAS LT! Click here to view

Intro to AM Methods and Maraging Steel Case Study Deals with maraging steel. Click the link to watch this short webinar with a Q&A session.
Click here to view

 

Please click to view additional webinars

 

 

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