The EIKOS Atom Probe offers:

• Three-dimensional tomography with nanoscale characterization of microstructures
• High spatial resolution single atom detection with high efficiency
• Equal sensitivity to all elements and their isotopes
• Quantitative composition measurement (sub-nm to near micron scale)
• Available in voltage or voltage & laser configurations
• Standard specimen preparation methods

EIKOS is available in 2 configurations:

EIKOS
The base EIKOS system incorporates a reflectron design to provide excellent mass resolving power and signal to noise. A pre-aligned integrated counter electrode ensures ease of use and high reliability. The voltage pulsing system provides very high data quality on a wide variety of metallurgical applications.

EIKOS-UV
The fully configured EIKOS-UV system combines all the outstanding features of the base EIKOS (voltage pulsed, reflectron based functionality, prealigned counter electrode) and adds a fully integrated 355 nm laser pulsing module with computer controlled focused spot design to provide access to a larger application range.

The base EIKOS system is field upgradable to the EIKOS-UV.

Grain boundary analysis in metals (APT)

The LEAP 5000 and EIKOS Atom Probes offer unique capabilities for nanoscale chemical analysis and 3D imaging of grain boundaries in metals and alloys. 

Keep Reading

Investigation of phase change separation processes (APT)

Thanks to unique spatial resolution capabilities, CAMECA Atom Probes can investigate phase separation processes in energy storage materials. Keep Reading

 Flyer - EIKOS

 Application 01 - R&D of Nuclear Structural Alloys

 Application 02 - Grain Boundary Engineering

 Application 03 - Synergistic t-EBDS/TKD & APT Analysis

 Application 04 - Optimization of Additively Manufactured Materials

 Standard FIB lift-out sample preparation procedure for APT

 Standard FIB sharpening procedure for APT

 Practical use of capping for FIB specimen preparation and APT

 Cross-section FIB lift-out and ARM mounting procedure for APT

 Backside FIB lift-out and ARM mounting procedure for APT

 On the isolation of single semiconductor devices for APT

 APT Specimen preparation: Electropolishing

 FIB Mounting to wire substrates

 Transmission EBSD of APT Specimens

 STEM for APT

An Introduction to Atom Probe Tomography

Looking for a brief overview of the technique? Perfect for sharing with researchers just starting in APT.

Grain boundaries in NdFeB alloy - 3D Atom Probe data combined with t-EBSD

The grain boundaries visible in the tEBSD data show copper segregation (orange dots) and a NdO precipitate (gray dots). Combining crystallographic data with 3D APT data provides for a more complete picture of the material.

Introduction to applications & technology of EIKOS-UV

Optimized or efficiency and simplicity, EIKOS-UV™ delivers all the benefits of Atom Probe Tomography and addresses a wide range of applications: metals, coatings, thin films, ceramics, minerals, functional materials in both academic and commercial environments. Register here to view at any time. Click here to view

An Introduction to IVAS LT

If you have atom probe data, and are looking for an efficient and free method to conduct analyses, check out IVAS LT. This free version of IVAS software allows you to conduct a number of different tests on your data. Learn more by watching this free, short webinar, and then download your copy of IVAS LT! Click here to view

Intro to AM Methods and Maraging Steel Case Study Deals with maraging steel. Click the link to watch this short webinar with a Q&A session.
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